X-ray Failure Analysis Testing for Smart Cards

X-Ray testing is part of Q-Card Laboratories' Failure Analysis testing services.

X-ray testing identifies card failures, manufacture defects, and other anomalies that standard tests can't find. By using non-destructive x-rays, a form of electromagnetic radiation, detailed images are produced to help determine where a problem may be.

Because the x-ray images produce such a fine degree of detail, troubleshooting chipcards is much easier. The test helps improve existing transaction systems and eliminates problems before they happen. By using x-ray tests, companies can gain insight and experience when designing new cards or equipment.

X-ray testing helps identify defects in the card. Detailed imaging even sees through embedded chips for comprehensive analysis.